Sponsored by NEMI, NIST, NSF, and TMS

Thursday, February 15, 2001
8:30am – 4:30pm
New Orleans, LA

• Meeting Report
  
• Agenda (40K PDF)
  
• Welcome - Carol Handwerker, NIST (96K PDF)
  
• NEMI Task Force Overview - Ron Gedney, NEMI;Jasbir Bath, Solectron (184K PDF)
  
• NSF Assessment of Environmental Issues in Electronics Manufacturing - Cynthia Murphy, University of Texas, Austin (480K PDF)
  
• Overview of Reliability Models and Data Needs - Ahmer Syed, Amkor (1.1MB PDF)
  
• Constitutive and Damage Accumulation Modeling - Leon Keer, Northwestern University (550K PDF)
  
• Manufacturing and Reliability Modeling - Chris Bailey, University of Greenwich (3.2MB PDF)
  
• Materials Issues for Developing a Reliability Methodology - Darrel Frear, Motorola (1.8MB PDF)
• Experiments Needed to Characterize Solder Joint Behavior - Alek Zubelewicz, Motorola (920K PDF)