Co-Chair:  Robert Carson (Cisco Systems)
Co-Chair: Wei Keat Loh (Intel)

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Problem statement

• Current standard is not adequate to predict good yield results at 1st and 2nd level assembly
• Measurement methods (dimensional and test) not common

Objectives

• Define the qualification method and criteria; e.g., sample size, precondition, variations of material and processes (1st and 2nd level)
• Establish measurement methods

Expected output

• Procedure and criteria reference for OEM and suppliers

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Further information

Jim Arnold (North America)
Tel: +1 480-854-0906
Mobile: +1 480-703-0133
jim.arnold@inemi.org

Haley Fu (Asia)
+86 21 5835 3839
haley.fu@inemi.org