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Flip Chip

Standard Description Status
J-STD-012 Implementation of Flip Chip & Chip Scale Technology released January 1996; ANSI approved
J-STD-026 Semiconductor Design Standard for Flip Chip Applications released August 1999; ANSI approved
J-STD-027 Mechanical Outline Standard for Flip Chip or Chip Size Configurations interim final
J-STD-028 Performance Standard for Construction of Flip Chip and Chip Scale Bumps released August 1999; ANSI approved
J-STD-029 Performance and Reliability Test Methods for Flip Chip, Chip Scale, BGA and Other Surface Mount Array Package Applications official representative proposal
J-STD-030 Guideline for Selection, Application of Underfill Material for Flip Chip and Other Micropackages working draft
J-STD-032 Performance Standard for Ball Grid Array Balls released 2002

These standards, developed jointly with IPC and EIA/JEDEC, provide common specifications for design, construction and test of flip chip. In this way, process yields, reliability and performance criteria can be reproduced in a highly predictable fashion leading to more rapid introduction and acceptance by industry.

IPC specifications (search by standard number)

Microvia

Standard Description Status
IPC-2315 Design Guide for High Density Interconnects and Microvias released June 2000; published jointly with the Japan Printed Circuits Association
IPC-2226 Design Standard for High-Density Array or Peripheral Leaded Component Mounting Structures official representative proposal
IPC-4104 Specifications for High-Density Interconnect (HDI) and Microvia Materials released May 1999; ANSI approved
IPC-6016 Qualification & Performance Specification for High Density Interconnect (HDI) Layers or Boards released May 1999; ANSI approved

This group of standards were the result of a joint project between the IPC's former Interconnection Technology Research Institute (ITRI) and NEMI, with ITRI taking the lead on the development effort. Combined, these standards enable industry to implement microvia technology for broad use. They provide guidelines and detailed information about design, materials and fabrication, and even help manufacturers know what to expect in usage.

IPC specifications (search by standard number)

  

Embedded Passives

Standard Description Status
IPC-4902 Specification for Materials for Embedded Passive Devices for Printed Boards working draft
not assigned Design Standard for High-Density Array or Peripheral Leaded Component Mounting Structures in development

Optoelectronics - Fiber Handling

Standard Description Status
8413-1 Specification for Process Carriers Used to Handle Optical Fibers in Manufacturing released April 2003

Developed jointly by IPC and NEMI's Fiber Handling Project, this standard defines standard practices for handling various kinds of optical fiber along with specifications and guidelines to be used in the design of carriers for these fibers in component manufacturing. The objective is not to define a particular carrier design, but to define enough requirements and guidelines to facilitate the use of fiber carriers in fiber optic component manufacturing, particularly in automated or semi-automated processes.


Lead-Free Assembly

Standard Description Status
J-STANDARD-020B Moisture/Reflow Sensitivity Classification for Non-Hermetic Solid State Surface Mount Devices released July 2002; ANSI approved

This standard identifies the classification level of non-hermetic (e.g., plastic) solid state surface mount devices (SMDs) that are sensitive to moisture-induced stress and determines what classification level should be used for initial reliability qualification. Once identified, the SMDs can be properly packaged, stored and handled to avoid subsequent thermal and mechanical damage during the assembly solder reflow attachment and/or repair operation. The original standard (J-STANDARD-020) was revised to cover components to be processed at higher temperatures for lead-free assembly. NEMI's Lead-Free Assembly Project provided input for revision of the standard.

IPC specifications (search by standard number)