Structural Test of External Memory (Boundary Scan Adoption, Phase 2)

End-of-Project Webinar, Phase 2 Addendum

  • Webinar will be held on May 7 for Boundary Scan, Phase 2 (Testing DDR Memory) in conjunction with BIST, Phase 3 (Short-Term and Long-Term Strategies for Use Case Standarization)
  • Registration is required
  • This webinar is for iNEMI members only
  • More information and registration

End-of-Project Webinar, Phase 2

Structural Test of External Memory Devices (Boundary Scan Adoption Project, Phase 2) (May 24, 2012)

Project Objective

This initiative will evaluate potential solutions to issues related to memory device testing to identify what the current and future industry best practices are.

Statement of Work and Project Statement (PDF file)

To join the project, please sign the Project Statement dated July 16, 2010

Sign-up for the addendum will end on February 17, 2012.

For Additional Information

David Godlewski
+1 717-651-0522
dgodlewski@inemi.org
 

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