Extended Reliability Assessment for Electronic Components
Section: Sustainable Electronics

Project Leader

Su Chen, Keysight Malaysia


Statement of Work and Project Statement


Extended reliability assessment can be used to identify and select products to be refurbished or re-assembled for longer use, helping companies reduce their consumption of raw materials, processes and waste. However, there is limited data (e.g., increased lifetime of used parts, qualification process for extended use) and a lack of standard processes to assess extended reliability of electronic components.

iNEMI has formed the Extended Reliability Assessment for Electronic Components team as part of the ongoing effort to enable circular economy principles. This team is developing and defining a methodology for part selection and stress testing that will allow for component usage beyond their initially assessed or “standard” shelf life.

To do so, the project will set up proof-of-concept extended reliability data collection from new “common market parts” that will encompass:

  • Part selection: criteria for parts to be studied for extended reliability, based on part type, use, re-usability, criticality, etc.
  • Test/stress methodology: tests and stresses required to assess extended lifetime of a product: stress to fail, pass/fail criteria, number of reworks, etc.


  • Define and propose a methodology for selecting existing electronic components for extended reliability. Extended reliability includes use in initial application for longer period than qualified for, or capability to be re-furbished or re-used. In addition, the methodology will define the stress testing to simulate extended electronic component use.
  • Address the lack of reliability standards to enable successfully extending the reliability of electronics components by providing a data-based approach to determining the extended use of electronic components. 


  • Identify and classify new components by type (application), re-workability and criticality on system
  • Select components (ICs, passives or others) and subject to extended reliability testing and if possible, re-use reliability models to assess reliability extension
  • Select parts in use post 3+ years and subject to testing to assess further fail rates
  • Phase 1 will define a methodology for assessing the extended reliability for new/unused existing electronic components identified by the team. Testing is planned for Phase 2.

Longer Term

  • Share best practices and experiences across the industry
  • Develop standard for understanding or assessing a part long term reliability

Benefits to Industry

  • Ability for users to assess real lifetime of a component
  • Enable systematic refurbishment, design for durability, cost and/or waste reduction
  • Proof of concept for standard developments in the future 
  • Proof of concept for extended lifetime or storage life of a component with economical relevance
  • Framework to assess useful lifetime of electronic parts
  • Framework to translate to business models/resource impact
  • Provide more flexibility in the supply chain to address shortages of parts/materials by increasing component reliability and durability

For Additional Information

Mark Schaffer