5G/mmWave Materials Assessment and Characterization
Section: 5G Electronics

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Project Leaders


Say Phommakesone,  Keysight 

Richard Stephenson, EMD Group

Dr. Chang-Sheng Chen, ITRI 

2023 Project Leadership Award

Congratulations to the 5G/mmWave Materials Assessment and Characterization project team for receiving a 2023 iNEMI Project Leadership Award. These awards recognize projects that have demonstrated superior performance of electronics manufacturing practices, provided solutions that enable significant technology and business results and/or had a positive impact on the electronics manufacturing value chain and its ecosystem. The project team members are:

Project Co-leaders:

  • Say Phommakesone,  Keysight Technologies

  • Richard Stephenson, EMD Group

  • Dr. Chang-Sheng Chen, ITRI

Participating Companies

AGC-Nelco  Keysight
AT&S  MacDermid Alpha
Centro Ricerche FIAT-FCA  Mosaic 
EM Nokia 
Flex Panasonic
Georgia Tech  QWED
Hitachi Chemical (now Resonac Sheldahl 
Ibiden  Shengyi 
IBM Unimicron
Intel Wistron




End-of-Project Webinar 

Webinar presentation (includes link to recorded webinar)
Thursday, June 2, 2022 

Project Reports

  • Report 1: Benchmark Current Industry Best Practices for Low Loss Measurements (November 2020)  
  • Report 2: Benchmark Emerging Industry Best Practices for Low Loss Measurements (November 2020)
  • Report 3: A Round Robin Study to Determine Measurement Accuracies of Commercial Resonator-Based Techniques (January 2022)

Project Update

Download the latest update (December 22, 2021)

Statement of Work & Project Statement


Next-generation 5G communications solutions require ultra-low loss laminate materials and PCBs/substrates for efficient design and manufacturing. However, these materials pose challenges. For example, there is no consistent methodology for measuring transmission loss or Df/Dk, especially for higher frequencies (e.g., >30 GHz). Many different approaches are currently used, requiring different fixtures and test methods, sample preparation, and/or data analysis/extraction. 

Project Focus

The goal of this project is to develop a guideline/best practice for a standardized measurement  and test methodology that can be shared with industry and relevant standards organizations. Initial focus will be to benchmark current available test methods and provide pro/con analysis, identify gaps (if any) for extending test methods to 5G/mmWave frequencies, as well as develop reliable reference standard materials for set-up and calibration.

The project will have two distinct phases:

  • Phase 1: Develop technical guidelines and generate best practices for characterization of ultra-low loss laminate materials in the range of 5-100 GHz
  • Phase 2: Extend the guidelines to PCB/substrate level characterization 

iNEMI Tech Topic Series 2021: 5G/mmWave 


Please note: several of the following presentations and/or papers are only available from the conference proceedings.

Standardize Material Characterization to Enhance Future Communication and Sensing Application,” Chang-Sheng Chen, PhD, Industrial Technology Research Institute (ITRI), iNEMI Session at IMPACT 2023, October 25, 2023; Taipei, Taiwan (available to members only)

Microwave Materials Keynote: “Recent Developments and Cross-Calibration of Resonator-Based Techniques for Microwave and mmWave Materials Assessment," Malgorzata Celuch and Marzena Olszewska-Placha (QWED), presented by Malgorzata Celuch, Microwave Materials and their Applications (MMA) conference, September 27, 2023; Mainz, Germany.

Microwave & Radar Week (MRW) 2022 (September 12-17; Gdansk, Poland) These presentations are available to iNEMI members only; log-in required to download. 
  • iNEMI Workshop on Microwave and Millimetre-Wave Characterization of Dielectric Sheets: presentations by Dr. Marzena Olszewska-Placha (QWED, Bartlomiej Salski (Warsaw University of Technology) and Michael Hill, PhD (Intel)
  • Conference Keynote: “Correlating mmWave Permittivity Measurement Tools with an Introduction to Intel’s Metrology Capability Analysis,” Michael Hill, PhD (Intel)
iNEMI 5G/mmWave Presentations at Device Packaging Conference (March 8; Fountain Hills, Arizona USA) (Please note: we do not have permission to post these presentations; please check with iMAPS for conference proceedings.)
  • Industry Challenges for Low Loss Measurements, Urmi Ray (iNEMI) and Say Phommakesone  (Keysight)
  • Key Highlights from iNEMI 5G Project, Michael Hill (Intel)
  • 5G Electronics: Bridging the Measurement Challenges, Magorzata Celuch and Marzena Olszewska-Placha (QWED)
  • mmWave Reference Material Development at NIST, Nathan Orloff (NIST)
The 5G/mmWave Materials Assessment and Characterization Project, Report 3: A Round Robin Study to Determine Measurement Accuracies of Commercial Resonator-Based Techniques (January 2022) 
"Innovative Approaches to Solve Low Loss Materials Characterization Challenges," invited presentation, Urmi Ray (iNEMI), Electronic Materials and Applications 2022, Session S13: 5G Materials and Applications Telecommunications — Metrology and Characterization of Materials, January 22, 2022, virtual event).

5G/High Frequency Materials Characterization Challenges and Opportunities,” Urmi Ray (iNEMI), Electronic Materials and Applications (EMA) Conference, American Ceramic Association (January 22, 2021; virtual event).
  • “Measuring Complex Permittivity for 5G/mmWave Materials,” Hanna Kähäri (Nokia), Session 3.1: Equipment and Materials for Enabling High Performance, Connecting Heterogeneous Systems Summit, September 1, 2021 (virtual event)
  • “Solving High Frequency Materials Characterization Challenges in 5G Electronics,” Urmi Ray (iNEMI), webinar sponsored by the International Wireless Industry Consortium (IWIC), June 16, 2021  
  • “5G/High Frequency Materials Test Challenges: Closing the Gaps via E2E Supply Chain Collaborative Innovation,” Urmi Ray (iNEMI), NIST Workshop: Securing the 5G Supply Chain through Measurement, Potential Adoption Paths for Measurements in 5G Hardware Security Session, May 19, 2021      
  • High Frequency Measurements Using Wafer Level Techniques: Measuring Low dK/dFMaterials from 1 GHz to 1 THz,” presented by Nathan Orloff (NIST), iNEMI session at ICEP, May 13, 2021 (virtual event).     
  • 5G Electronics Challenges: High Frequency Materials Characterization 
    iNEMI Invited Session at the International Conference on Device Packaging
    April 14, 2021 (virtual event)

    Session Chair: Urmi Ray, iNEMI
    Presentations and speakers:
    • “Challenges for High Dk/Df Measurements,” Urmi Ray (iNEMI)

    • “Benchmarking Resonator based Low Dk/Df Material Measurements,” Richard Stephenson (EMD Electronics)

    • “Recent Developments of Resonator Measurements for Emerging Materials and Technologies,” Magorzata Celuch & Marzena Olszewska-Placha (QWED)

    • “High Frequency Measurements Using Wafer Level Techniques,” Nathan Orloff (NIST)

    • “Optimizing Measurement Accuracy and Repeatability for High Frequency Measurements,” Say Phommakesone and Daisuke Kato (Keysight Technologies)

  • iNEMI Technical Session: 5G/High Frequency Materials Characterization Challenges and Opportunities
    IPC APEX EXPO / March 12, 2021 
    Moderator: Urmi Ray (iNEMI) 
    • "High Frequency Measurements Using Wafer Level Techniques," Nathan Orloff (NIST)

    • "Benchmarking Resonator Based Low Dk/Df Material Measurements," Michael Hill (Intel) and Malgorzata Celuch (QWED)  

    • "Optimizing Measurement Accuracy and Repeatability for High Frequency Measurements," Say Phommakesone and Daisuke Kato (Keysight)


  • Panel Session: Packaging Challenges & Opportunities for 5G Applications
    Electronics Packaging Technology Conference (EPTC)

    December 4, 2019; Singapore

    Moderator: Dr. Haley Fu, iNEMI 
iNEMI co-organized a session at EPTC that featured a diverse panel of speakers who outlined the key drivers and applications for 5G such as high-speed computing, smart phones, automotive, networking, IoT, etc. Discussions from session contributed to the development of iNEMI’s initiative on 5G mmWave material characterization and testing.

Urmi Ray