Board Assist Self-Test (BA-BIST): Short-Term and Long-Term Strategies for Use Case Standardization


Zoë Conroy, Cisco

Alfred L. Crouch, ASSET InterTech


This presentation introduces the concept of board-assist (BA-BIST) as enhanced IC BIST functionality for board testability and fault isolation. It discusses the board defects targeted by BA-BIST, the most required BISTs, industry “use cases” for board test BA-BIST, and the relation to existing standards. (Presented at APEX 2014, Las Vegas, Nevada, USA.)

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