iNEMI Tech Topic Series: Counterfeit Components
About the Series
Counterfeit components have become a multi-million-dollar issue within the electronics industry that can affect every segment of the market, including consumer goods, networking and communications, medical, automotive, aerospace, and defense. Use of counterfeits can lead to increased scrap rates, early field failures, and increased rework rates, all of which are not only costly but can damage brand reputation and — in the case of mission critical systems — represent a hazard.
This iNEMI webinar series is focused on counterfeit issues and challenges in the supply chain. The objective of the series is to:
- Understand perspectives regarding hardware counterfeit along the value chain
- Identify key and credible reference sources and standards
- Identify any key gaps that need to be addressed
- Identify and share current and potential best practices
If you are interested in one of these topics but unable to attend, please register for the webinar and we will send you a link to the presentation and webinar recording following the event.
For additional information about this webinar series, contact Mark Schaffer (firstname.lastname@example.org).
The series kicked off with a discussion about the overall size and breadth of counterfeiting risks facing the global electronics supply chain. It will provide a brief overview of some of the ways counterfeit threats can manifest throughout various parts of the end-to-end supply chain and will conclude with a conversation on the unique challenges and perspectives of mitigating counterfeiting risks within the contract manufacturing sector. Speakers: Ben German (Intel Corporation), Michelle Lam (IBM), and Charles Woychik (SkyWater Technology). See report.
The second session focuses on standards that address issues related to counterfeits, such as detection, traceability, mitigation, reporting and more. Speakers: Michael Azarian (University of Maryland), Richard Smith (ERAI), and Michael Ford (Aegis Software). See report.
The third session will look at emerging technologies for detection and mitigation. We will also talk about roadmapping smart manufacturing solutions for component/material assurance, and review results of an industry survey regarding experiences with counterfeit components and strategies used to mitigate risk. Speakers: Navid Asadi, PhD (University of Florida), Francis Mullany, PhD (iNEMI), Paul Hale, PhD (NIST), Ben German (Intel Corporation) and Mark
Schaffer, moderator (iNEMI). Agenda and speaker bios.