Start Date: 5/17/2022 9:00 AM EDT
End Date: 5/17/2022 10:00 AM EDT
May 17, 2022
9:00-10:00 a.m. EDT (Americas)
3:00-4:00 p.m. CEST (Europe)
9:00-10:00 p.m. CST (China)
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Guest Speaker: David Locker, Jr.
U.S. Army Aviation and Missile Center
The qualification of an electronic device requires consideration of the application life cycle profile (stresses from environments and operation) and the relevant failure mechanisms of the device exposed to the application stresses. To fully characterize the performance in the application, the qualification must also account for the failure distribution of the various relevant failure mechanisms, and also the synergistic effects of the different mechanisms. This presentation will discuss methods to address these factors in determining qualification and performance characterization requirements, as well as determining whether a given set of qualification data meets a particular application requirement.
About the Speaker
David Locker has served as an electronic components engineer supporting U.S. Army programs for more than 30 years. He has participated in numerous efforts to develop, document, and implement best practices for assuring electronics reliability as a member of industry standards bodies and consortia, including the Society of Automotive Engineers, International Electrotechnical Commission, IPC, JEDEC, iNEMI, Aerospace Vehicle Systems Institute, and Center for Advanced Vehicle and Extreme Environments Electronics. He also serves as lead for the Preparing Activity of MIL-STD-11991, General Standard for Parts, Materials, and Processes.