Start Date: 5/6/2021 11:00 AM EDT
End Date: 5/6/2021 12:00 PM EDT
Standard Reference Materials for 5G and Microwave Materials at NIST
Thursday, May 6, 2021
11:00 a.m.—12:00 p.m. EDT (Americas)
5:00—6:00 p.m. CEST (Europe)
Presenter: Dr. Nathan Orloff, NIST
This iNEMI webinar will introduce the National Institute of Standards and Technology’s (NIST) microwave materials program, the path to develop traceable mmWave standard reference materials. Nate Orloff (NIST) will discuss how this new standard will impact on-wafer calibration standards, traceable power, phase and impedance. Having introduced NIST’s goals, Dr. Orloff will provide a list of essential equipment needed to perform the on-wafer calibrations then walk through the device layout and discuss each device in the calibration kit. He will also explain what each device does, and how it is used in the calibration, then go through the calibration step-by-step, providing examples of ways to check your work as you go. The webinar will wrap up with an explanation of how to use NIST software with data from the on-wafer calibration kit. Participants will be asked to provide feedback about how to best execute the program and provide input about emerging needs in the telecommunications industry.
About the Speaker
Nathan (Nate) D. Orloff is the Project Leader of the Microwave Materials Project in the Communications Technology Laboratory at National Institute of Standards and Technology (NIST) in Boulder, Colorado. His research focuses on standards, materials-by-design for communications, microwave materials metrology, and bridging the gap between optical and microwave on-wafer measurement science.
Dr. Orloff earned a B.S. degree with high honors and Ph.D. in physics from the University of Maryland (UMD) at College Park, College Park, MD, USA, in 2004 and 2010, respectively. In 2011, he was a Dean’s Fellow with the Department of Bioengineering, Stanford University. In 2013, he joined the Materials Measurement Laboratory, Gaithersburg, MD, USA, as a Rice University Postdoctoral Fellow. In 2014, he joined the Communications Technology Laboratory at NIST in Boulder Colorado.
In 2020, the Department of Commerce selected Dr. Orloff for a Bronze Medal, recognizing his innovations in dielectric measurement. He was the 2019 Karl Schwartzwalder-Professional Achievement in Ceramic Engineering Award from the American Ceramic Society. Dr. Orloff has published about seventy peer-reviewed articles and proceedings. He holds a U.S. Patent on measuring material properties in roll-to-roll manufacturing, and a provisional patent on scanning waveguide ellipsometry.
Upcoming Webinars in the 5G/mmWave Technical Sharing Series
Broadband Dielectric Characterization of Polymers and Glass (April 8)