Start Date: 8/3/2021 9:00 AM HKT
End Date: 8/3/2021 10:00 AM HKT
Session 2 (APAC)
August 3, 2021
9:00-10:00 a.m. CST (China)
9:00-10:00 p.m. EDT on August 2 (Americas)
Extended reliability assessment can be used to select products to be refurbished or re-assembled for longer use, reducing consumption of raw materials, processes and waste. However, there is limited data (e.g., increased lifetime of used parts, qualification process for extended use) and a lack of standard processes to assess extended reliability of electronic components.
iNEMI's new Extended Reliability Assessment for Electronic Components project will collect data on select components and develop a standardized procedure for extended reliability assessment and component classification. Juan Dominquez (Intel) will chair the project.
For additional information, contact Mark Schaffer (firstname.lastname@example.org).
Session 1 (Americas & EMEA)
August 2, 2021
11:00 a.m. — 12:00 p.m. EDT (Americas)
5:00-6:00 p.m. CEST (Europe)