Jeffrey Lee, IST
Mark Schaffer, iNEMI
Brook Sandy-Smith, Indium
Yaw Obeng, NIST
Jeffrey Lee, WangChu Chen, Dem Lee & Peggy Liou, IST-Integrated Service Technology, Inc.
The Automotive Electronic Material Challenges Project team discusses the dominant failure mechanisms in automotive electronics for selected components and materials. They also analyze the correlation of material properties to specific environmental conditions, identify gaps between standard consumer electronic test methods and typical automotive test conditions, and present their methodology for analysis. (Presented at ICEPT 2015, Changsha, China.)
Please enter your details below.