Optical Device Inspection & Cleaning Program Connector Particle Thickness Investigation, Phase 1

Chair:  David Fisher (Tyco Electronics)

Scope of Work
Previous work by the iNEMI group on assessing the impact of end-face contamination on performance of mated connectors has shown increases in insertion loss and decreases in return loss (increase in reflectance).  While a portion of this is explained by the fact that the contamination is directly over the fiber core(s), there are cases where the contamination surrounds the core but does not obstruct the optical path.

The primary goal of this project is to develop a method that can be used to determine the effect from lens contamination for a given transceiver module with a set of disclosed design parameters, such as wavelength, lens-fiber distance, effective optical area, etc.

Statement of Work and Project Statement (PDF files)

    Statement of Work (Version 3.1; August 2, 2010)

    Project Statement (Version 3.1; August 2, 2010) 

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