AgendaIntroductions and INEMI OverviewDavid Godlewski, INEMI
Connector Particles Thickness: Project statusTatiana Berdinskikh, Celestica International Inc.
Connector separation DOE for contaminated samplesDave Fisher, TE Connectivity
Controlled separation experimental resultsDoug Wilson, PVI Systems
Design for optics cleanlinessMark Marino, Juniper Networks and Timothy Buelow, Plexus
Evaluation result of scratches and defects on the endface for multi-fiber rectangle ferrule fiber optic connectorsTakashi Shibuya, NEC, and Hideki Isono, Fujitsu
Sensitivity of 40G optic link to conenctor quality: BER and eye diagram dataTatiana Berdinskikh, Celestica International Inc.
Standardization study of cleaning method of connector endface for pluggable receptacle type optical transceiversTakashi Shibuya, NEC, and Hideki Isono, Fujitsu
Development of cleanliness specification for lens-based TOSA and ROSAGlenn Victor, Oplink, and Doug Wilson, PVI Systems
Operational issues related to optical connectors used in carriersRyo Nagase, Yoshiteru Abe
Fully Automated inspection and cleaning systemTom Micheltree, FiberQA, LLC
Design and performance of PRIZM® LightTurn® connector cleanerJillcha Wakjira, US Conec
Design and performance of SFP module cleanerToshiaki Satake, USConec
Further information
David Godlewski
1 717-651-0522
[email protected]