San Francisco, California | March 10, 2014

Introductions and INEMI Overview
David Godlewski, INEMI

Project Background and Standardization Activities on Development of Cleanliness Specification for Fiber Optic Connectors and Lens-Based Transceivers
Tatiana Berdinskikh, Celestica International Inc.

SOW Update:  Inspection Criteria for Expanded Beam Optics
Tom Mitcheltree, US Conec, Ltd.

Measuring Repeatability and Reproducibility of End Face Inspection Systems
Doug Wilson, Fiber QA

Expanded Beam MT Mate/Demate Performance
Tom Schiltz, Molex

Updates on IEC/TR 62572-4: Guideline for Optical Connector End-Face Cleaning Methods for Receptacle Style Optical Transceivers
Ryo Nagase, Chiba Institute of Technology

Return Performance of Lensed Plastic MM 36-Fiber Connector for Data Center Applications
Toshiaki Satake, USConec

Inspection System Qualification Requirements for IEC 61300-3-35
Matt Brown, JDSU

Precise Laser Induced Defects in Silica
David Robinson, Arden Photonics

Fiber Optic Products
Ed Forrest, ITW Chemtronics