San Diego, California | March 12, 2018

INEMI Optoelectronics TIG and Project Meeting Presentations

Agenda

Introductions and INEMI Overview
David Godlewski, INEMI

Development of Cleanliness Specification for Expanded Beam Connectors Project, Phase 2
Tatiana Berdinskikh, Celestica

Sample Preparation & Evaluation (presentation coming soon)
Tom Mitcheltree, US Conec

Study of the Loss Due to Applied Contamination on Prism-MT Expanded Beam Lenses
Doug Wilson, FiberQA

Data Analysis and Preliminary Results
Michael Kadar-Kallen, CommScope

MM Fiber Connection Loss under EF Launched Condition — Ray Tracing Simulation and Experimental Results
Toshiaki Satake, US Conec

Expanded Beam Connector under Contamination Measurement and Modeling
Ke Wang, US Conec

Cleaning Solutions for Expanded Beam Connector
Tiger Ninomiya, Senko; Bernard Lee, Senko

Scratch Analysis for IEC SC86B WG4 Round Robin
Doug Wilson, FiberQA; Vitalina Rudyk, Sumix; Gang He, EXFO

IPSR Session at OFC 2018

Presentations