Pittsburgh, Pennsylvania | May 10, 2012

Introductions & Keynote - Session 1

• Workshop Introduction – Bill Bader, INEMI CEO
• Key Findings of INEMI MEMS Roadmap – Dr. Michael Gaitan, Leader, Enabling Devices Group, NIST
• R&D Challenges for MEMS – Jean-Philippe Polizzi, Microsystem Program Mgr, CEA-Leti
• Output of INEMI UK Workshop – Bill Bader

MEMS Supply Chain & Technology Challenges - Session 2

• MEMS Supply Chain Challenges – Dr. Mikhail Pinelis, CEO, MEMS Journal
• MEMS Technology & Product Gaps – Dr. Janusz Bryzek, Development VP, MEMS & Sensor Solutions, Fairchild Semiconductor

MEMS Reliability Gaps - Session 3

• Reliability Challenges for MEMS Technologies – Mike Aldrich, Reliability Engineering Group Leader, MEMS and Sensor Technology Products, Analog Devices, Inc. (presentation coming soon)

Breakout Discussions - Session 4

• MEMS Reliability/Test Breakout Group
• Other MEMS Opportunities Breakout Group